Application of generalized ellipsometry to anisotropic crystals*

Application of spectroscopic ellipsometry and Mueller ellipsometry to optical characterization.

This article provides a brief overview of both established and novel ellipsometry techniques, as well as their applications. Ellipsometry is an indirect optical technique, in that information about the physical properties of a sample is obtained through modeling analysis. Standard ellipsometry is typically used to characterize optically isotropic bulk and/or layered materials. More advanced tec...

Modulated generalized ellipsometry

Generalized Ellipsometry Analysis of Anisotropic Nanoporous Media: Polymer-infiltrated Nanocolumnar and Inverse-column Polymeric Films

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Technique for anisotropic extension of organic crystals: application to temperature dependence of electrical resistance.

We have developed a technique for the anisotropic extension of fragile molecular crystals. The pressure medium and the instrument, which extends the pressure medium, are both made from epoxy resin. Since the thermal contraction of our instrument is identical to that of the pressure medium, the strain applied to the pressure medium has no temperature dependence down to 2 K. Therefore, the degree...

Generalized ellipsometry based on azimuth measurements alone